test pattern generator
by Qualcomm
CVEs (1)
| CVE | Vendor / Product | Sev | Risk | CVSS | EPSS | KEV | Published | Description |
|---|---|---|---|---|---|---|---|---|
| CVE-2024-53017 | Med | 0.43 | 6.6 | 0.00 | Jun 3, 2025 | Memory corruption while handling test pattern generator IOCTL command. |
- risk 0.43cvss 6.6epss 0.00
Memory corruption while handling test pattern generator IOCTL command.