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Medium severity6.6NVD Advisory· Published Jun 3, 2025· Updated Jun 17, 2026

CVE-2024-53017

CVE-2024-53017

Description

Memory corruption while handling test pattern generator IOCTL command.

Affected products

6

Qualcomm/test pattern generatorllm-create
Qualcomm, Inc./Snapdragonv5
Range: SDM429W
Qualcomm/Sdm429w Firmware
cpe:2.3:o:qualcomm:sdm429w_firmware:-:*:*:*:*:*:*:*
Qualcomm/Snapdragon 429 Mobile Platform Firmware
cpe:2.3:o:qualcomm:snapdragon_429_mobile_platform_firmware:-:*:*:*:*:*:*:*
Qualcomm/Wcn3620 Firmware
cpe:2.3:o:qualcomm:wcn3620_firmware:-:*:*:*:*:*:*:*
Qualcomm/Wcn3660b Firmware
cpe:2.3:o:qualcomm:wcn3660b_firmware:-:*:*:*:*:*:*:*

Patches

Vulnerability mechanics

References

1

docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.htmlnvdVendor Advisory

News mentions

0

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