Sw5100 Firmware
by Qualcomm
CVEs (470)
| CVE | Vendor / Product | Sev | Risk | CVSS | EPSS | KEV | Published | Description |
|---|---|---|---|---|---|---|---|---|
| CVE-2021-35103 | Hig | 0.51 | 7.8 | 0.00 | Apr 1, 2022 | Possible out of bound write due to improper validation of number of timer values received from firmware while syncing timers in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired… | ||
| CVE-2021-30333 | Hig | 0.51 | 7.8 | 0.00 | Apr 1, 2022 | Improper validation of buffer size input to the EFS file can lead to memory corruption in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables | ||
| CVE-2023-21652 | Hig | 0.50 | 7.7 | 0.00 | Aug 8, 2023 | Cryptographic issue in HLOS as derived keys used to encrypt/decrypt information is present on stack after use. | ||
| CVE-2022-22069 | Hig | 0.50 | 7.7 | 0.00 | Sep 2, 2022 | Devices with keyprotect off may store unencrypted keybox in RPMB and cause cryptographic issue in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables | ||
| CVE-2026-25292 | Hig | 0.49 | 7.6 | 0.00 | Aug 4, 2026 | Memory Corruption when processing untrusted user input in the fastboot command handler for audio framework configuration. | ||
| CVE-2025-47318 | Hig | 0.49 | 7.5 | 0.00 | Sep 24, 2025 | Transient DOS while parsing the EPTM test control message to get the test pattern. | ||
| CVE-2025-27066 | Hig | 0.49 | 7.5 | 0.00 | Aug 6, 2025 | Transient DOS while processing an ANQP message. | ||
| CVE-2025-21454 | Hig | 0.49 | 7.5 | 0.00 | Jul 8, 2025 | Transient DOS while processing received beacon frame. | ||
| CVE-2025-21449 | Hig | 0.49 | 7.5 | 0.00 | Jul 8, 2025 | Transient DOS may occur while processing malformed length field in SSID IEs. | ||
| CVE-2025-21435 | Hig | 0.49 | 7.5 | 0.00 | Apr 7, 2025 | Transient DOS may occur while parsing extended IE in beacon. | ||
| CVE-2025-21430 | Hig | 0.49 | 7.5 | 0.00 | Apr 7, 2025 | Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session. | ||
| CVE-2025-21429 | Hig | 0.49 | 7.5 | 0.00 | Apr 7, 2025 | Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request. | ||
| CVE-2024-53027 | Hig | 0.49 | 7.5 | 0.00 | Mar 3, 2025 | Transient DOS may occur while processing the country IE. | ||
| CVE-2024-33069 | Hig | 0.49 | 7.5 | 0.00 | Oct 7, 2024 | Transient DOS when transmission of management frame sent by host is not successful and error status is received in the host. | ||
| CVE-2024-33049 | Hig | 0.49 | 7.5 | 0.00 | Oct 7, 2024 | Transient DOS while parsing noninheritance IE of Extension element when length of IE is 2 of beacon frame. | ||
| CVE-2024-33051 | Hig | 0.49 | 7.5 | 0.00 | Sep 2, 2024 | Transient DOS while processing TIM IE from beacon frame as there is no check for IE length. | ||
| CVE-2024-33050 | Hig | 0.49 | 7.5 | 0.00 | Sep 2, 2024 | Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper. | ||
| CVE-2024-33048 | Hig | 0.49 | 7.5 | 0.00 | Sep 2, 2024 | Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame. | ||
| CVE-2024-33025 | Hig | 0.49 | 7.5 | 0.00 | Aug 5, 2024 | Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE. | ||
| CVE-2024-33024 | Hig | 0.49 | 7.5 | 0.00 | Aug 5, 2024 | Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length. |
- risk 0.51cvss 7.8epss 0.00
Possible out of bound write due to improper validation of number of timer values received from firmware while syncing timers in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables, Snapdragon Wired…
- risk 0.51cvss 7.8epss 0.00
Improper validation of buffer size input to the EFS file can lead to memory corruption in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Voice & Music, Snapdragon Wearables
- risk 0.50cvss 7.7epss 0.00
Cryptographic issue in HLOS as derived keys used to encrypt/decrypt information is present on stack after use.
- risk 0.50cvss 7.7epss 0.00
Devices with keyprotect off may store unencrypted keybox in RPMB and cause cryptographic issue in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables
- risk 0.49cvss 7.6epss 0.00
Memory Corruption when processing untrusted user input in the fastboot command handler for audio framework configuration.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing the EPTM test control message to get the test pattern.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while processing an ANQP message.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while processing received beacon frame.
- risk 0.49cvss 7.5epss 0.00
Transient DOS may occur while processing malformed length field in SSID IEs.
- risk 0.49cvss 7.5epss 0.00
Transient DOS may occur while parsing extended IE in beacon.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.
- risk 0.49cvss 7.5epss 0.00
Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request.
- risk 0.49cvss 7.5epss 0.00
Transient DOS may occur while processing the country IE.
- risk 0.49cvss 7.5epss 0.00
Transient DOS when transmission of management frame sent by host is not successful and error status is received in the host.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing noninheritance IE of Extension element when length of IE is 2 of beacon frame.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while processing TIM IE from beacon frame as there is no check for IE length.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing MBSSID during new IE generation in beacon/probe frame when IE length check is either missing or improper.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing the received TID-to-link mapping element of beacon/probe response frame.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing the BSS parameter change count or MLD capabilities fields of the ML IE.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing the ML IE when a beacon with length field inside the common info of ML IE greater than the ML IE length.
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