S5 Gen 2 Sound Platform Firmware
by Qualcomm
CVEs (4)
| CVE | Vendor / Product | Sev | Risk | CVSS | EPSS | KEV | Published | Description |
|---|---|---|---|---|---|---|---|---|
| CVE-2025-47317 | Hig | 0.51 | 7.8 | 0.00 | Sep 24, 2025 | Memory corruption due to global buffer overflow when a test command uses an invalid payload type. | ||
| CVE-2025-47318 | Hig | 0.49 | 7.5 | 0.00 | Sep 24, 2025 | Transient DOS while parsing the EPTM test control message to get the test pattern. | ||
| CVE-2025-47342 | Hig | 0.46 | 7.1 | 0.00 | Oct 9, 2025 | Transient DOS may occur when multi-profile concurrency arises with QHS enabled. | ||
| CVE-2025-47370 | Med | 0.42 | 6.5 | 0.00 | Nov 4, 2025 | Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan. |
- risk 0.51cvss 7.8epss 0.00
Memory corruption due to global buffer overflow when a test command uses an invalid payload type.
- risk 0.49cvss 7.5epss 0.00
Transient DOS while parsing the EPTM test control message to get the test pattern.
- risk 0.46cvss 7.1epss 0.00
Transient DOS may occur when multi-profile concurrency arises with QHS enabled.
- risk 0.42cvss 6.5epss 0.00
Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan.