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High severity7.8NVD Advisory· Published Feb 3, 2025· Updated Jun 17, 2026

CVE-2024-45573

CVE-2024-45573

Description

Memory corruption may occour while generating test pattern due to negative indexing of display ID.

Affected products

2

Qualcomm, Inc./Snapdragonv5
Range: FastConnect 6700
Qualcomm/DisplayIdllm-create

Patches

Vulnerability mechanics

References

1

docs.qualcomm.com/product/publicresources/securitybulletin/february-2025-bulletin.htmlnvdVendor Advisory

News mentions

0

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